This website uses cookies primarily for visitor analytics. Certain pages will ask you to fill in contact details to receive additional information. On these pages you have the option of having the site log your details for future visits. Indicating you want the site to remember your details will place a cookie on your device. To view our full cookie policy, please click here. You can also view it at any time by going to our Contact Us page.

SICK unveils a “snapshot” of the future

21 February 2017

SICK UK will be revealing standout developments to its machine vision and imaging capabilities at the first UKIVA Machine Vision Conference on 27 April in Milton Keynes set to open new doors for Industry 4.0-ready manufacturing and logistics.

The show will be the first time in the UK that vision specialists, system integrators and end-users will have an opportunity to experience at first hand, through interactive exhibits, key advances in user-programmability and ‘snapshot’ 3D Vision as part of SICK’s comprehensive 2D and 3D vision portfolio.

The show will be a launch pad for:

• SICK’s new open software platform, SICK AppSpace which can be used to develop and implement tailor-made application solutions on SICK programmable devices. Hailed as an exciting new “eco-system” for bespoke application development, SICK AppSpace gives users unprecedented flexibility to exploit SICK’s growing range of smart vision systems and intelligent sensors
• The new SICK SIM4000 Sensor Integration Machine, a high-performance, one-box, multi-core processor that can integrate multiple cameras and sensors together with powerful image processing. 
• The Inspector P, SICK’s first fully user-programmable range of 2D vision cameras with all the performance and flexibility needed for critical duties in verification, inspection and quality control. 
• The Visionary 3D camera, which uses “snapshot 3D” camera technology to provide a robust solution for industrial applications which benefit from having 3D data delivered in one shot, for example obstacle recognition, collision warning systems or pallet handling applications.  

Says Neil Sandhu, SICK’s National Product Manager for Imaging, Measurement, Ranging & Systems: “We are excited about the establishment of the UKIVA Machine Vision Conference and have been proud to work closely with UKIVA in getting this important new industry forum up and running.

“The show is a very timely one for SICK because we have a number of ground-breaking new developments to share that open up new opportunities for our customers to develop application-specific solutions and to implement them into their machines and systems with ease.

“Visitors will even be able to see themselves imaged in our Visionary 3D ‘snapshot’ system on the stand, and discuss its potential for solution development with our team of vision, imaging and ranging experts on the stand.”


Contact Details and Archive...

Print this page | E-mail this page