I/O module for digital and analogue test & measurement
26 June 2012
JTAG Technologies has introduced the JT 2149/DAF, a compact, mixed-signal (Digital/Analogue/Frequency) measurement module, offering both digital and analogue test access to PCBs via JTAG Technologies’ QuadPod signal conditioning interface. When connected to a circuit board via edge connector or test fixture/jig test pins the module enhances standard digital boundary-scan tests by enabling a series of analogue and frequency measurements to be made.
Capabilities of the module include 16 dual-purpose digital pins capable of digital I/O stimulus and response at voltages of 1.0 to 3.6V plus frequency measurements of up to 128MHz on any pin. 12 additional analogue measurement channels can capture values from 0 to 33V with better than 10mV resolution. One further channel is available as a clock generator, programmable up to 64MHz.
Test engineers often wish to check circuit fundamentals, such as voltage rails and clock frequencies, before undertaking more stringent boundary-scan based structural and functional tests. The JT 2149/DAF is perfect for this application and helps the system builder who might ordinarily use an extra piece of test equipment.
The JT 2149/DAF can be controlled through an interactive panel (virtual instrument) within JTAG ProVision as well as through Python scripts. A full Python API is included as part of JTAG Technologies current ProVision releases.
Contact Details and Archive...