High precision profile measurements of highly polished surfaces
16 August 2015
A new range of 2D/3D blue laser profile sensors (laser line scanners) that work with shiny, highly polished surfaces, as well as transparent materials is now available from Micro-Epsilon.
The scanCONTROL BL series of blue laser profile sensors operate using blue (violet) laser technology rather than red. The special characteristics of the blue wavelength laser light make the scanners suitable for measuring against shiny, highly polished metals, as well as red-hot glowing metals and silicon-based materials.
All the controls and electronics are integrated in an extremely lightweight, compact sensor design, enabling the scanners to be installed in locations where there may be little space available for mounting. The scanCONTROL BL series offers a range of interfaces and flexible installation options.
The series is available with measuring ranges up to 265mm in the z-axis (distance/profile height) and up to 143.5mm in the x-axis (laser line length/profile width). Output of measurement data is via Ethernet (UDP, Modbus) or serial interface (RS422, Modbus). In addition, analogue signals or digital switching signals can be output directly to a PLC. Profile frequencies of up to 2,000Hz and a measuring rate of up to 2,560,000 points/sec enable the sensors to be used in high speed applications.
Micro-Epsilon has also released a new LabVIEW driver for scanCONTROL series sensors. The LabVIEW instrument driver 2.4 (available as a 32-bit or 64-bit version) is a convenient interface between sensor and LabVIEW test and measurement environments. As well as updating existing modules, further ones have been added that enable faster, easier set up and configuration of scanCONTROL sensors. In addition, the driver includes several example programs that illustrate the ease of use of these modules.
The new web-based ‘Application Finder’ intelligent software tool allows users to search for the appropriate laser profile sensor from Micro-Epsilon’s scanCONTROL series by considering a number of application-related search criteria.
On accessing the Application Finder users are presented with three main search criteria: by Material, by Measurement or by Industry. Within each of these sections, users can further refine their searches by clicking on a variety of filters.
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