This website uses cookies primarily for visitor analytics. Certain pages will ask you to fill in contact details to receive additional information. On these pages you have the option of having the site log your details for future visits. Indicating you want the site to remember your details will place a cookie on your device. To view our full cookie policy, please click here. You can also view it at any time by going to our Contact Us page.

Improving production efficiency and quality with dynamic force measurement

12 March 2021

The Kistler Group offers a webinar on how dynamic force measurement methods can help to optimise production efficiency and product quality for semiconductor manufacturing on Tuesday, March 30, 16:00 – 17.00 CEST.

Kistler Group
Kistler Group

New applications like AI, 5G or IoT have increased the demands on the performance of semiconductors. This also poses new challenges for production as the importance of quality inspection and process monitoring increases. 

The speakers – Robert Hillinger, Business Development Manager at Kistler, and Jim Macy, Application Expert – will demonstrate how force measurement solutions by Kistler allow to monitor mechanical stress during the production process and reduce ppm rejection rate as well as increase machine performance and speed accuracy. The participants will find out how the Kistler portfolio can enable them to master the manufacturing challenges ahead while benefiting from higher process visibility, lower quality cost and traceability of process data.

To register, click here. Those interested but unable to attend the webinar are kindly invited to register, too. All registrants will be able to access the recording of the webinar afterwards.

Contact Details and Archive...

Print this page | E-mail this page