Improving production efficiency and quality with dynamic force measurement
12 March 2021
The Kistler Group offers a webinar on how dynamic force measurement methods can help to optimise production efficiency and product quality for semiconductor manufacturing on Tuesday, March 30, 16:00 – 17.00 CEST.
New applications like AI, 5G or IoT have increased the demands on the performance of semiconductors. This also poses new challenges for production as the importance of quality inspection and process monitoring increases.
The speakers – Robert Hillinger, Business Development Manager at Kistler, and Jim Macy, Application Expert – will demonstrate how force measurement solutions by Kistler allow to monitor mechanical stress during the production process and reduce ppm rejection rate as well as increase machine performance and speed accuracy. The participants will find out how the Kistler portfolio can enable them to master the manufacturing challenges ahead while benefiting from higher process visibility, lower quality cost and traceability of process data.
To register, click here. Those interested but unable to attend the webinar are kindly invited to register, too. All registrants will be able to access the recording of the webinar afterwards.
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