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Capacitive sensor measures gap width in difficult-to-access areas

20 April 2012

Micro-Epsilon has introduced a high accuracy, non-contact capacitive displacement sensor for measuring gap widths in difficult-to-access areas, a flexible probe being manipulated and bent around obstacles in order to measure these widths. The capaNCDT CSG sensor is capable of measuring gap widths of 0.9mm up to 4.9mm with a resolution as fine as 90nm (given a metal measurement target and a relatively clean measurement gap).

In addition to the CSG sensor, Micro-Epsilon has a similar version that offers larger measuring ranges. The new capaNCDT CSE sensor has the same dimensions as the CSG but provides up to 2.5 times larger measuring ranges. This is achieved by equipping the sensor with a shielded electrode that is set back from the probe; so, for a similar measuring range, the CSE sensor dimensions are significantly smaller.

For applications that require sub-nanometre resolution and multi-channel measurements, the CSG and CSE sensors can be used in conjunction with Micro-Epsilon’s non-contact, capacitive measurement system, the 19in rack mounting or bench top style capaNCDT 6500. This system offers sub-nanometre resolution, good temperature stability and rapid changeover of sensors without any re-calibration required.

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