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New support option adds boundary-scan capability to 6TL functional testers

07 December 2012

JTAG Technologies and its partner 6TL have announced a high-level JTAG support option for the YAVJTAG and YAVJTAH test card modules. This move will enable 6TL users and systems builders to provide JTAG Test and ISP (in-system-programming) capabilities using JTAG Technologies’ software platforms, such as ProVision and Production Integration Packages (PIP).

The YAV9JTAG and YAV9JTAH tester cards are part of 6TL’s ‘YAV’ series, developed to allow test engineers to build fully equipped functional test systems quickly and economically. Both units offer over 100 channel of digital I/O that can be controlled by a JTAG (IEEE std. 1149.1) interface and are connected to the target to extend the coverage of boundary-scan through to PCB connectors and/or test points. 

The YAV9JTAG also includes an embedded boundary-scan controller that is compatible with JTAG Technologies’ developer and run-time systems making this a self-contained JTAG tester. The YAV9JTAH on the other hand features eight each of analogue measurement and stimulus channels in addition to the digital I/O plus two serial (RS232) ports.

Control of, and taking measurements from, the YAV9JTAH is achieved via a boundary-scan controller, such as JTAG Technologies’ JT 37x7 ‘DataBlaster’ family, the more compact JT 3705/USB Explorer model or even the YAV9JTAG companion product.

Users of integrated JTAG Technologies’ products benefit from off-line, fixtureless test preparation and the re-use of stand-alone applications at other stages of the product lifecycle such as prototyping and field service.

Furthermore, the combination of functional test and boundary-scan draws on the strengths of both technologies and achieves excellent cost-effectiveness through reduced test fixture complexity.


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